Paper recorded by Signals 4 on 2026-09-18 in cs.CV. Abstract reproduced from arXiv; link to the original below.
Published 2026-09-18 on arXiv · recorded by Signals 4 on 2026-09-21
Category: cs.CV · 计算机视觉 · first seen 2026-09-21
Wafer map defect recognition is commonly formulated as a fixed-taxonomy classification problem that assigns each wafer to a single defect class. However, some wafers exhibit morphologies near class boundaries, for which forcing a single prediction may be less informative than providing plausible diagnostic alternatives. This paper proposes a morphology-aware ambiguity learning framework that suppo