Bias-Induced Crossover in Absolute Capacity of Dense Associative Memory

Paper recorded by Signals 4 on 2026-09-15 in cs.LG. Abstract reproduced from arXiv; link to the original below.

Published 2026-09-15 on arXiv · recorded by Signals 4 on 2026-09-16

Category: cs.LG · 机器学习 · first seen 2026-09-16

Abstract

The absolute capacity of dense associative memory has mainly been analyzed for unbiased patterns. Here we examine the effect of bias in centered binary patterns under the Krotov-Hopfield single-site criterion $P_{\mathrm{error}}=1/N$, where $P_{\mathrm{error}}$ is the probability that a single-site flip lowers the energy of a stored pattern and $N$ is the number of neurons. Each pattern component

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